Surface roughness scattering in MOS structures.

Date

2010

Advisors

Journal Title

Journal ISSN

ISSN

1876-1100

DOI

Volume Title

Publisher

Type

Conference

Peer reviewed

Yes

Abstract

Description

Keywords

Citation

Shah, R. and DeSouza, M. (2010) Surface roughness scattering in MOS structures. Lecture Notes in Electrical Engineering, 60 pp. 117-127

Rights

Research Institute