Method for measuring source resistance Rs in saturation region of GaN HEMT device over bias conditions (Vgs,Vds)
Date
2004-03
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Advisors
Journal Title
Journal ISSN
ISSN
0013-5194
Volume Title
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Type
Article
Peer reviewed
Abstract
Description
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Citation
Oxley, C.H. (2004) Method for measuring source resistance Rs in saturation region of GaN HEMT device over bias conditions (Vgs,Vds), Electronics Letters, 40 (5), 4th March 2004, pp 344-346