Offset difference measure enhancement for the feature-selective validation method.
Date
2008
Authors
Advisors
Journal Title
Journal ISSN
ISSN
0018-9375
Volume Title
Publisher
IEEE Institute of Electrical and Electronics
Type
Article
Peer reviewed
Yes
Abstract
Description
Keywords
Citation
Duffy, A. P., Orlandi, A. and Sasse, H. (2008) Offset difference measure enhancement for the feature-selective validation method. IEEE Transactions on Electromagnetic Compatibillity, 50 (2), pp. 413-415.