Substrate selection for the optical analysis of nickel oxide thin films

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dc.cclicenceN/Aen
dc.contributor.authorManjunatha, Krishna Namaen
dc.contributor.authorPaul, Shashien
dc.date.accessioned2016-04-19T10:07:56Z
dc.date.available2016-04-19T10:07:56Z
dc.date.issued2015-05-08
dc.description.abstractThe transmittance and absorbance data of nickel oxide films are crucial in determining it's optical properties. Selection of substrate is important for a greater understanding of optical constants and properties of a material. In view of this Nickel oxide films were deposited on Quartz substrates and it's properties are compared with Nickel oxide films deposited on glass. We show the difference in optical constants measured for Nickel oxide thin film deposited on glass and quartz substrates.en
dc.funderN?Aen
dc.identifier.citationManjunathan, K.N. and Paul, S. (2015) Substrate selection for the optical analysis of nickel oxide thin films. 2014 International Conference on Advances in Engineering and Technology (ICAET),en
dc.identifier.doihttps://doi.org/10.1109/ICAET.2014.7105254
dc.identifier.isbn9781479949496
dc.identifier.urihttp://hdl.handle.net/2086/11931
dc.language.isoenen
dc.peerreviewedYesen
dc.projectidN/Aen
dc.publisherIEEEen
dc.researchgroupEmerging Technologies Research Centreen
dc.researchinstituteInstitute of Engineering Sciences (IES)en
dc.subjectlassen
dc.subjectNickelen
dc.subjectOptical constantsen
dc.subjectOptical propertiesen
dc.subjectQuartzen
dc.subjectSubstratesen
dc.subjectThin films Absorbance dataen
dc.subjectNickel oxide thin filmsen
dc.subjectOptical analysisen
dc.subjectQuartz substrateen
dc.subjectSubstrate selectionen
dc.titleSubstrate selection for the optical analysis of nickel oxide thin filmsen
dc.typeConferenceen

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