Substrate selection for the optical analysis of nickel oxide thin films

Date

2015-05-08

Advisors

Journal Title

Journal ISSN

ISSN

Volume Title

Publisher

IEEE

Type

Conference

Peer reviewed

Yes

Abstract

The transmittance and absorbance data of nickel oxide films are crucial in determining it's optical properties. Selection of substrate is important for a greater understanding of optical constants and properties of a material. In view of this Nickel oxide films were deposited on Quartz substrates and it's properties are compared with Nickel oxide films deposited on glass. We show the difference in optical constants measured for Nickel oxide thin film deposited on glass and quartz substrates.

Description

Keywords

lass, Nickel, Optical constants, Optical properties, Quartz, Substrates, Thin films Absorbance data, Nickel oxide thin films, Optical analysis, Quartz substrate, Substrate selection

Citation

Manjunathan, K.N. and Paul, S. (2015) Substrate selection for the optical analysis of nickel oxide thin films. 2014 International Conference on Advances in Engineering and Technology (ICAET),

Rights

Research Institute