Substrate selection for the optical analysis of nickel oxide thin films
Date
2015-05-08
Authors
Advisors
Journal Title
Journal ISSN
ISSN
Volume Title
Publisher
IEEE
Type
Conference
Peer reviewed
Yes
Abstract
The transmittance and absorbance data of nickel oxide films are crucial in determining it's optical properties. Selection of substrate is important for a greater understanding of optical constants and properties of a material. In view of this Nickel oxide films were deposited on Quartz substrates and it's properties are compared with Nickel oxide films deposited on glass. We show the difference in optical constants measured for Nickel oxide thin film deposited on glass and quartz substrates.
Description
Keywords
lass, Nickel, Optical constants, Optical properties, Quartz, Substrates, Thin films Absorbance data, Nickel oxide thin films, Optical analysis, Quartz substrate, Substrate selection
Citation
Manjunathan, K.N. and Paul, S. (2015) Substrate selection for the optical analysis of nickel oxide thin films. 2014 International Conference on Advances in Engineering and Technology (ICAET),