Formation of misfit dislocations in strained-layer GaAs/InxGa1-xAs/GaAs heterostructures during post-fabrication thermal processing
Date
2003
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ISSN
0021-8979
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Article
Peer reviewed
Abstract
Description
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Citation
Liu, X.W., Hopgood, A.A., Usher, B.F., Wang, H. and Braithwaite, N.St.J. (2003) Formation of misfit dislocations in strained-layer GaAs/InxGa1-xAs/GaAs heterostructures during post-fabrication thermal processing. Journal of Applied Physics, 94, pp. 7496-7501.