Formation of misfit dislocations in strained-layer GaAs/InxGa1-xAs/GaAs heterostructures during post-fabrication thermal processing

Date

2003

Advisors

Journal Title

Journal ISSN

ISSN

0021-8979

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Type

Article

Peer reviewed

Abstract

Description

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Citation

Liu, X.W., Hopgood, A.A., Usher, B.F., Wang, H. and Braithwaite, N.St.J. (2003) Formation of misfit dislocations in strained-layer GaAs/InxGa1-xAs/GaAs heterostructures during post-fabrication thermal processing. Journal of Applied Physics, 94, pp. 7496-7501.

Rights

Research Institute