Investigating the stability of thin film transistors with zinc oxide as the channel layer
Date
2007
Authors
Advisors
Journal Title
Journal ISSN
ISSN
Volume Title
Publisher
Type
Conference
Peer reviewed
Yes
Abstract
Description
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Citation
Cross, R. B. M. De Souza, M. M. (2007) Investigating the stability of thin film transistors with zinc oxide as the channel layer. IEEE International Reliability Physics Symposium, pp. 467-471.
Rights
Research Institute
Institute of Engineering Sciences (IES)