Investigating the stability of zinc oxide thin film transistors.

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dc.contributor.authorCross, R. B. M.
dc.contributor.authorDe Souza, M. M.
dc.date.accessioned2010-01-28T09:56:43Z
dc.date.available2010-01-28T09:56:43Z
dc.date.issued2006
dc.identifier.citationCross, R. B. M.; De Souza, M. M. (2006) Investigating the stability of zinc oxide thin film transistors. Applied Physics Letters, 89 (26), p. 263513.en
dc.identifier.doihttps://doi.org/10.1063/1.2425020
dc.identifier.issn0003-6951
dc.identifier.urihttp://hdl.handle.net/2086/3260
dc.language.isoenen
dc.peerreviewedYesen
dc.publisherAmerican Institute of Physicsen
dc.researchinstituteInstitute of Engineering Sciences (IES)en
dc.titleInvestigating the stability of zinc oxide thin film transistors.en
dc.typeArticleen

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