Investigating the stability of zinc oxide thin film transistors.

Date

2006

Authors

Cross, R. B. M.
De Souza, M. M.

Advisors

Journal Title

Journal ISSN

ISSN

0003-6951

DOI

https://doi.org/10.1063/1.2425020

Volume Title

Publisher

American Institute of Physics

Type

Article

Peer reviewed

Yes

Abstract

Description

Keywords

Citation

Cross, R. B. M.; De Souza, M. M. (2006) Investigating the stability of zinc oxide thin film transistors. Applied Physics Letters, 89 (26), p. 263513.

URI

http://hdl.handle.net/2086/3260

Rights

Research Institute

Institute of Engineering Sciences (IES)

Collections

School of Engineering and Sustainable Development