Use of carbon micro-particles for improved infrared temperature measurement of CMOS MEMS devices.

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dc.contributor.authorHopper, Richard
dc.contributor.authorHaneef, Ibraheem
dc.contributor.authorAli, Syed Zeeshan
dc.contributor.authorUdrea, Florin
dc.contributor.authorOxley, C. H.
dc.date.accessioned2010-04-09T13:14:41Z
dc.date.available2010-04-09T13:14:41Z
dc.date.issued2010-04
dc.identifier.citationHopper, R.H. et al. (2010) Use of carbon micro-particles for improved infrared temperature measurement of CMOS MEMS devices. Measurement, science and technology, 21 (4), pp. 045107en
dc.identifier.doihttps://doi.org/10.1088/0957-0233/21/4/045107
dc.identifier.issn0957-0233
dc.identifier.urihttp://hdl.handle.net/2086/3696
dc.language.isoenen
dc.publisherIOPen
dc.researchgroupCentre for Electronic and Communications Engineering
dc.titleUse of carbon micro-particles for improved infrared temperature measurement of CMOS MEMS devices.en
dc.typeArticleen

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