Use of Carbon Micro-particles for improved IR surface temperature measurements of CMOS MEMs Devices

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dc.contributor.authorHaneel, I.en
dc.contributor.authorUdrea, Florinen
dc.contributor.authorOxley, C. H.en
dc.contributor.authorHopper, R. H.en
dc.contributor.authorAli, S.en
dc.date.accessioned2013-08-08T14:01:38Z
dc.date.available2013-08-08T14:01:38Z
dc.date.issued2010-04
dc.identifier.citationHopper, R.H. et al. (2010) Use of Carbon Micro-particles for improved IR surface temperature measurements of CMOS MEMs Devices. IOP Measurement Science and Technology, 21 (4) 045107en
dc.identifier.doihttps://doi.org/10.1088/0957-0233/21/4/045107
dc.identifier.urihttp://hdl.handle.net/2086/8876
dc.language.isoenen
dc.researchgroupCentre for Electronic and Communications Engineeringen
dc.titleUse of Carbon Micro-particles for improved IR surface temperature measurements of CMOS MEMs Devicesen
dc.typeArticleen

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