The effect of gate-bias stress and temperature on the performance of ZnO thin-film transistors.

Date

2008

Advisors

Journal Title

Journal ISSN

ISSN

1530-4388

Volume Title

Publisher

IEEE

Type

Article

Peer reviewed

Abstract

Description

Keywords

Citation

Cross, R. B. M. and De Souza, M. M. (2008) The effect of gate-bias stress and temperature on the performance of ZnO thin-film transistors. IEEE Transactions on Device and Materials Reliability, 8 (2), pp. 277-282.

Rights

Research Institute

Institute of Engineering Sciences (IES)