The effect of gate-bias stress and temperature on the performance of ZnO thin-film transistors.
Date
2008
Authors
Advisors
Journal Title
Journal ISSN
ISSN
1530-4388
Volume Title
Publisher
IEEE
Type
Article
Peer reviewed
Abstract
Description
Keywords
Citation
Cross, R. B. M. and De Souza, M. M. (2008) The effect of gate-bias stress and temperature on the performance of ZnO thin-film transistors. IEEE Transactions on Device and Materials Reliability, 8 (2), pp. 277-282.