Micro-Scale Infrared Thermal Characterisation of Electronic Devices

Date

2010-04

Authors

Oxley, C. H.
Hopper, Richard

Advisors

Journal Title

Journal ISSN

ISSN

DOI

Volume Title

Publisher

Type

Other

Peer reviewed

Abstract

Description

Keywords

Citation

Oxley, C.H and Hopper, R.H. (2010) Micro-Scale Infrared Thermal Characterisation of Electronic Devices. KTN Focus, pp. 16-19

URI

http://hdl.handle.net/2086/8854

Rights

Research Institute

Collections

School of Engineering and Sustainable Development