Probe propels IR thermal microscopy to a new level

Date

2011

Authors

Oxley, C. H.
Hopper, Richard
Prime, Dominic
Leaper, Mark C.
Evans, Gwynne
Levick, Andrew

Advisors

Journal Title

Journal ISSN

ISSN

DOI

Volume Title

Publisher

Type

Article

Peer reviewed

Abstract

Description

Keywords

Citation

Oxley, C., Hopper, R., Prime, D., Leaper, M., Evans, G. and Levick, A. (2011) Probe propels IR thermal microscopy to a new level, technology. ! IR microscopy, Jan/Feb, 17, pp. 33-36

URI

https://www.compoundsemiconductor.net
 http://hdl.handle.net/2086/5868

Rights

Research Institute

Collections

School of Engineering and Sustainable Development