Improved Infrared Imaging of Semiconductor Devices

Date

2014-10

Advisors

Journal Title

Journal ISSN

ISSN

DOI

Volume Title

Publisher

Formatex Research Centre

Type

Book chapter

Peer reviewed

Yes

Abstract

Description

Keywords

emissivity, infra red microscope, particle sensor, temperature measurement, semiconductor, electronic devices

Citation

Hopper, R.A. and Oxley, C.H. (2014) Improved Infrared Imaging of Semiconductor Devices. In: A. Méndez-Vilas, Ed. Microscopy: Advances in Scientific Research and Education (Microscopy book series - 2014 Edition) pp. 697-702

Rights

Research Institute