Improved Infrared Imaging of Semiconductor Devices
Date
2014-10
Authors
Advisors
Journal Title
Journal ISSN
ISSN
DOI
Volume Title
Publisher
Formatex Research Centre
Type
Book chapter
Peer reviewed
Yes
Abstract
Description
Keywords
emissivity, infra red microscope, particle sensor, temperature measurement, semiconductor, electronic devices
Citation
Hopper, R.A. and Oxley, C.H. (2014) Improved Infrared Imaging of Semiconductor Devices. In: A. Méndez-Vilas, Ed. Microscopy: Advances in Scientific Research and Education (Microscopy book series - 2014 Edition) pp. 697-702