Reducing the Functional Safety Risks (and other risks) that can be caused by EMI – new IEEE Standard 1848

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dc.cclicenceCC-BY-NC-NDen
dc.contributor.authorArmstrong, Keith
dc.contributor.authorDuffy, A. P.
dc.date.acceptance2020-06-10
dc.date.accessioned2020-08-19T11:04:41Z
dc.date.available2020-08-19T11:04:41Z
dc.date.issued2020-06-10
dc.descriptionThe file attached to this record is the author's final peer reviewed version. The Publisher's final version can be found by following the DOI link.en
dc.description.abstractWhen Functional Safety risks must be reduced throughout the lifecycle of an electronic system, the acceptable levels for the risks that could be caused by electromagnetic disturbances or electromagnetic interference (EMI) are about 100dB lower than normal for immunity tests. This means that these risks are in-capable of being verified or validated by immunity testing only. At the time of writing, IEEE Standard 1848 is well on its way towards being published. This is a new type of IEEE Standard, and will provide requirements and guidance on the use of well-proven techniques and measures to help ensure that neither electromagnetic disturbances nor EMI will be the cause of un-acceptable Functional Safety risks. It’s techniques and measures cover: project management; system design; operational design of hardware and software; verification, and validation. They also cover assem-bly/installation; commissioning, maintenance; upgrade; refur-bishment, and disposal. Although intended for reducing Functional Safety risks, the techniques and measures in IEEE 1848 can also be used for reducing any quantifiable risks (mission-critical, reputational, financial, etc.) that could be caused by electromagnetic disturb-ances or EMI.en
dc.funderNo external funderen
dc.identifier.citationArmstrong, K. and Duffy, A. (2020) Reducing the Functional Safety Risks (and other risks) that can be caused by EMI — new IEEE Standard 1848. IEEE Letters on Electromagnetic Compatibility Practice and Applications,en
dc.identifier.doihttps://doi.org/10.1109/LEMCPA.2020.2998050
dc.identifier.urihttps://dora.dmu.ac.uk/handle/2086/20074
dc.language.isoen_USen
dc.peerreviewedYesen
dc.publisherIEEEen
dc.researchinstituteInstitute of Engineering Sciences (IES)en
dc.titleReducing the Functional Safety Risks (and other risks) that can be caused by EMI – new IEEE Standard 1848en
dc.typeArticleen

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