Reducing the Functional Safety Risks (and other risks) that can be caused by EMI – new IEEE Standard 1848

Date

2020-06-10

Advisors

Journal Title

Journal ISSN

ISSN

Volume Title

Publisher

IEEE

Type

Article

Peer reviewed

Yes

Abstract

When Functional Safety risks must be reduced throughout the lifecycle of an electronic system, the acceptable levels for the risks that could be caused by electromagnetic disturbances or electromagnetic interference (EMI) are about 100dB lower than normal for immunity tests. This means that these risks are in-capable of being verified or validated by immunity testing only.
At the time of writing, IEEE Standard 1848 is well on its way towards being published. This is a new type of IEEE Standard, and will provide requirements and guidance on the use of well-proven techniques and measures to help ensure that neither electromagnetic disturbances nor EMI will be the cause of un-acceptable Functional Safety risks. It’s techniques and measures cover: project management; system design; operational design of hardware and software; verification, and validation. They also cover assem-bly/installation; commissioning, maintenance; upgrade; refur-bishment, and disposal.
Although intended for reducing Functional Safety risks, the techniques and measures in IEEE 1848 can also be used for reducing any quantifiable risks (mission-critical, reputational, financial, etc.) that could be caused by electromagnetic disturb-ances or EMI.

Description

The file attached to this record is the author's final peer reviewed version. The Publisher's final version can be found by following the DOI link.

Keywords

Citation

Armstrong, K. and Duffy, A. (2020) Reducing the Functional Safety Risks (and other risks) that can be caused by EMI — new IEEE Standard 1848. IEEE Letters on Electromagnetic Compatibility Practice and Applications,

Rights

Research Institute

Institute of Engineering Sciences (IES)