Time Domain Dielectric Spectroscopy: An Advanced Measuring System

Date

1996-05

Advisors

Journal Title

Journal ISSN

ISSN

Volume Title

Publisher

AIP publishing (American Institute of Physics)

Type

Article

Peer reviewed

Yes

Abstract

The new time domain measurement system for dielectric measurements is described. The current model is comprised of an IBM PC-AT/486, ‘‘TDM-2,’’ a new time domain measurement system, a set of thermostabilized sample holders, and operation and analysis software. This system is designed for use in the measurement of dielectric parameters of liquid and solid materials over the frequency range 100 kHz–10 GHz. Software consists of programs of registration, accumulation and data collection, Fourier analysis, time domain treatment, analysis software: fast and reliable nonlinear curve fitting programs to determine spectroscopic parameters and correlation analysis in time domain. The system utilizes the difference method of measurement with the registration of primary signals with multiwindow nonuniform sampling. Such a system permits the overlap of a frequency range of five orders in a single measurement

Description

Keywords

Citation

Feldman, Y. et al. (2016) Time Domain Dielectric Spectroscopy: An Advanced Measuring System. Review of Scientific Instruments, 67 (9), pp. 3208-3216

Rights

Research Institute