Factors influencing the successful validation of transient phenomenon modelling.

Date

2010

Advisors

Journal Title

Journal ISSN

ISSN

Volume Title

Publisher

IEEE

Type

Conference

Peer reviewed

Abstract

Description

Keywords

Citation

Telleria, R. J. et al (2010) Factors influencing the successful validation of transient phenomenon modelling. Symposium on Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific

Rights

Research Institute

Institute of Engineering Sciences (IES)