Improved infrared (IR) microscope measurements and theory for the micro-electronics industry.

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dc.contributor.authorOxley, C. H.en
dc.contributor.authorHopper, Richarden
dc.contributor.authorHill, G.en
dc.date.accessioned2012-01-25T10:18:34Z
dc.date.available2012-01-25T10:18:34Z
dc.date.issued2010
dc.identifier.citationOxley, C.H., Hopper, R.H., Hill, G. and Evans, G.A. (2010) Improved infrared (IR) microscope measurements and theory for the micro-electronics industry. Solid-State Electronics, 54 (1), pp. 63-66en
dc.identifier.doihttps://doi.org/10.1016/j.sse.2009.09.022
dc.identifier.issn0038-1101
dc.identifier.urihttp://hdl.handle.net/2086/5521
dc.language.isoenen
dc.peerreviewedYesen
dc.publisherElsevieren
dc.researchgroupCentre for Electronic and Communications Engineering
dc.titleImproved infrared (IR) microscope measurements and theory for the micro-electronics industry.en
dc.typeArticleen

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