Improved infrared (IR) microscope measurements and theory for the micro-electronics industry.
Date
2010
Authors
Advisors
Journal Title
Journal ISSN
ISSN
0038-1101
Volume Title
Publisher
Elsevier
Type
Article
Peer reviewed
Yes
Abstract
Description
Keywords
Citation
Oxley, C.H., Hopper, R.H., Hill, G. and Evans, G.A. (2010) Improved infrared (IR) microscope measurements and theory for the micro-electronics industry. Solid-State Electronics, 54 (1), pp. 63-66